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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12 by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III

ISBN 13: 9780471731726

Format: Hardcover (624 pages)
Publisher: Wiley-IEEE Press
Published: 04 Sep 2009


New : $196.97

New : $196.97